Development of tracking detectors with industrially produced GEM foils

IEEE Transactions on Nuclear Science

Volumn 54, Issue 6, 2007, Pages 2646-2652

  Simon, F ^a,b   Azmoun, B ^a,c   Becker, U ^b   Burns, L ^b   Crary, D ^d   Kearney, K ^d   Keeler, G ^d   Majka, R ^e   Paton, K ^f   Saini, G ^d   Smirnov, N ^e   Surrow, B ^b   Woody, C ^a,c  

^a IEEE   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d Tech Etch Inc   (United States)

^e Yale University   (United States)

^f UNIVERSITY OF SASKATCHEWAN   (Canada)

Author keywords

Gas electron multiplier (GEM); GEM foil production; Micro pattern gas detectors

Indexed keywords

GAS ELECTRON MULTIPLIER (GEM); GEM FOIL PRODUCTION; MICRO-PATTERN GAS DETECTORS; OPTICAL TESTS;

CORRELATION METHODS; ELECTRONS; GAS DETECTORS; METAL FOIL; TRACKING (POSITION); X RAYS;

RADIATION DETECTORS;

EID: 37249022919     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.909912     Document Type: Conference Paper

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