Powerful VCSEL arrays beat the heat

Laser Focus World

Volumn 43, Issue 11, 2007, Pages 81-83

  Arthur D'Asaro, L ^b   Seurin, Jean Francois ^b   Ghosh, Chuni ^a  

^a Princeton Optronics   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

CHILLERS; FAILURE RATES; OPTICAL OUTPUT; VERTICAL-CAVITY SURFACE-EMITTING LASER (VCSEL);

FAILURE ANALYSIS; HIGH TEMPERATURE ENGINEERING; OPTICAL PUMPING; RELIABILITY THEORY; SOLID STATE LASERS;

SURFACE EMITTING LASERS;

EID: 37149055682     PISSN: 10438092     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (5)

1. A. Moser, et al., J. Appl. Phys. 71, 4848 (1992).
2. H.-U. Pfeiffer et al., Proc. OFC 2002, 483 (March 2002).
3. U-L-M photonics, "VCSEL Chip Products Reliability Report," (October 2005).
4. J.A. Tatum et al., Proc. SPIE 3946, 2 (May 2000).
5. R.A. Morgan et al., IEEE Phot. Tech. Lett. 7, 441 (May 1995).