How to prevent DPA and fault attack in a unified way for ECC scalar multiplication ring extension method

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 4464 LNCS, Issue , 2007, Pages 225-237

  Baek, Yoo Jin ^a   Vasyltsov, Ihor ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER CRIME; ELECTRONIC CRIME COUNTERMEASURES; FAULT TOLERANCE; MODEL CHECKING;

ELLIPTIC CURVE CRYPTOSYSTEM(ECC); FAULT INJECTION ATTACKS; MULTIPLICATION RING EXTENSION METHOD;

CRYPTOGRAPHY;

EID: 37149051633     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-540-72163-5_18     Document Type: Conference Paper

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