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Volumn 102, Issue 11, 2007, Pages
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Directional electromigration-enhanced interdiffususion in the Cu-Ni system
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT DENSITY;
ELECTROMIGRATION;
ELECTRONIC PROPERTIES;
INTERDIFFUSIVITIES;
SAUER-FREISE-DEN BROEDER METHOD;
VACANCY-ATOM INTERACTION;
COPPER ALLOYS;
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EID: 37149039497
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2809444 Document Type: Article |
Times cited : (56)
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References (23)
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