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Volumn 102, Issue 11, 2007, Pages

Directional electromigration-enhanced interdiffususion in the Cu-Ni system

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTROMIGRATION; ELECTRONIC PROPERTIES;

EID: 37149039497     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2809444     Document Type: Article
Times cited : (56)

References (23)
  • 2
    • 0003971542 scopus 로고
    • edited by A. S.Nowick and J. J.Burton (Academic, New York
    • H. B. Huntington, in Diffusion in Solids, edited by, A. S. Nowick, and, J. J. Burton, (Academic, New York, 1975).
    • (1975) Diffusion in Solids
    • Huntington, H.B.1
  • 16
    • 37149002539 scopus 로고
    • Ph.D. thesis, The Pennsylvania State University
    • S. Kaja, Ph.D. thesis, The Pennsylvania State University, 1985.
    • (1985)
    • Kaja, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.