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Volumn 25, Issue 6, 2007, Pages 1976-1981
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Submicron aligned wafer bonding via capillary forces
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPILLARY FORCES;
SUBMICRON WAFERS;
DIGITAL INTEGRATED CIRCUITS;
DROP FORMATION;
ERROR ANALYSIS;
FINITE ELEMENT METHOD;
MATHEMATICAL MODELS;
WAFER BONDING;
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EID: 37149034345
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.2787866 Document Type: Article |
Times cited : (9)
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References (10)
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