Miniature electron/ion/soft-X-ray detector mounted on a conflat flange with an outer diameter of 70 mm

Shinku/Journal of the Vacuum Society of Japan

Volumn 50, Issue 9, 2007, Pages 583-585

  Fujita, Narihiko ^a   Mase, Kazuhiko ^b,c,d  

^a YOKOHAMA NATIONAL UNIVERSITY   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c GRADUATE UNIVERSITY FOR ADVANCED STUDIES   (Japan)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; MEASUREMENT THEORY; X RAY ANALYSIS;

CONFLAT FLANGES; GAS PHASES;

DETECTORS;

EID: 37149033078     PISSN: 05598516     EISSN: None     Source Type: Journal    
DOI: 10.3131/jvsj.50.583     Document Type: Article

References (11)

1. E. Kobayashi, K. Mase, A. Nambu and K. Fukui: Shinku, 48 (2005) 552 (in Japanese).
2. K. Mase, T. Tachibana, E. Kobayashi, M. Mori, H. Yagi, K. K. Okudaira, N. Ueno and I. Arakawa: Shinku, 48 (2005) 286 (in Japanese).
3. E. Kobayashi, A. Nambu, T. Kakiuchi and K. Mase: Shinku, 50 (2007) 57 (in Japanese).
4. K. Mase and N. Fujita; Registration of a new design for practical use in Japan, No. 2007-002120, March 28, 2007.
5. J. Stöhr: NEXAFS Spectroscopy (Springer, Berlin, 1996).
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10. T. Kakiuchi, E. Kobayashi, N. Okada, K. Oyamada, M. Okusawa, K. K. Okudaira and K. Mase: J. Electron Spectrosc. Relat. Phenom., in press.
11. http://jp.hamamatsu.com/resources/products/etd/pdf/F4655_F4655- 10_TMCP1003J04.pdf.