XPS characterization of YAlO3:Co single crystals

Crystal Research and Technology

Volumn 42, Issue 12, 2007, Pages 1341-1347

  Talik, E ^a   Kruczek, M ^a,b   Zarek, W ^a   Kusz, J ^a   Wojcik K ^a   Sakowska, H ^b   Szyrski, W ^b  

^a UNIVERSITY OF SILESIA   (Poland)

^b Department of Micro and Nanotechnology of Wide Bandgap Semiconductors   (Poland)

Author keywords

Characterization; Czochralski method; Surface structure

Indexed keywords

ALUMINA; ANNEALING; CHEMICAL SHIFT; COBALT COMPOUNDS; CRYSTAL GROWTH FROM MELT; SURFACE STRUCTURE; VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY; YTTRIUM COMPOUNDS;

IONIC BOND; OXYGEN IONS; VIOLET COLOUR;

SINGLE CRYSTALS;

EID: 37149001119     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.200711029     Document Type: Conference Paper

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