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Volumn , Issue 16, 1987, Pages 1248-1249
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Ultra-high vacuum preparation and characterization of ultra-thin layers of SiO2 on ZrO2 and TiO2 by chemical vapour deposition of Si(OEt)4
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 37049073545
PISSN: 00224936
EISSN: None
Source Type: Journal
DOI: 10.1039/C39870001248 Document Type: Article |
Times cited : (32)
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References (13)
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