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Volumn 202, Issue 8, 2008, Pages 1437-1442

Electrodeposition and characterization of silane thin films from 3-(aminopropyl)triethoxysilane

Author keywords

3 (aminopropyl)triethoxysilane; Electrodeposition; Ellipsometry; Scanning tunneling microscopy; Surface plasmon resonance; X ray photoelectron spectroscopy

Indexed keywords

BIOSENSORS; CHARACTERIZATION; CHEMICAL ANALYSIS; ELECTRODEPOSITION; ELECTROLYTES; FILM GROWTH; MORPHOLOGY; SURFACE PLASMON RESONANCE;

EID: 37049015194     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2007.06.038     Document Type: Article
Times cited : (21)

References (16)
  • 2
    • 0348225322 scopus 로고    scopus 로고
    • L.A. Vermeulen, K. Smith, J. Wang, 45, 1007 and references therein (1999).
  • 5
    • 37049007490 scopus 로고    scopus 로고
    • G. Herlem, patent PCT WOFR0101133 (2001).
  • 7
    • 0038302708 scopus 로고    scopus 로고
    • S. Sayen, A. Walcarius, 5, 341 (2003) and A. Walcarius, E. Sibottier, Electroanal., 17, 1716 (2005).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.