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Volumn 202, Issue 8, 2008, Pages 1437-1442
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Electrodeposition and characterization of silane thin films from 3-(aminopropyl)triethoxysilane
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Author keywords
3 (aminopropyl)triethoxysilane; Electrodeposition; Ellipsometry; Scanning tunneling microscopy; Surface plasmon resonance; X ray photoelectron spectroscopy
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Indexed keywords
BIOSENSORS;
CHARACTERIZATION;
CHEMICAL ANALYSIS;
ELECTRODEPOSITION;
ELECTROLYTES;
FILM GROWTH;
MORPHOLOGY;
SURFACE PLASMON RESONANCE;
TETRAHYDROFURANE;
SILANES;
BIOSENSORS;
CHARACTERIZATION;
CHEMICAL ANALYSIS;
ELECTRODEPOSITION;
ELECTROLYTES;
FILM GROWTH;
MORPHOLOGY;
SILANES;
SURFACE PLASMON RESONANCE;
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EID: 37049015194
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2007.06.038 Document Type: Article |
Times cited : (21)
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References (16)
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