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Volumn 9, Issue 1, 2008, Pages 149-154

Conductive atomic force microscopy (C-AFM) analysis of photoactive layers in inert atmosphere

Author keywords

Conductive atomic force microscopy; Inert atmosphere; Morphology; Photoactive layer; Polymer solar cell

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; MEASUREMENT THEORY; MORPHOLOGY; SOLAR CELLS;

EID: 37049000556     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2007.10.003     Document Type: Article
Times cited : (27)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.