Enargite by XPS

Surface Science Spectra

Volumn 9, Issue 1, 2002, Pages 266-274

  Fantauzzi, Marzia ^a   Atzei, Davide ^a   Da Pelo, Stefania ^a   Elsener, Bernhard ^a   Frau, Franco ^a   Lattanzi, Piero Franco ^a   Rossi, Antonella ^a  

^a UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

SULFUR COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

ENARGITE; ENVIRONMENTAL PROBLEMS; LIQUID NITROGEN TEMPERATURE; POTENTIAL SOURCES; TOXIC ELEMENTS;

COPPER COMPOUNDS;

EID: 36849086519     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/11.20030801     Document Type: Article

References (5)

1. D. Atzei, S. Da Pelo, B. Elsener, M. Fantauzzi, F. Frau, P. Lattanzi, and A. Rossi, An. Chim. 93, 11 (2003).
2. A. Rossi, D. Atzei, S. Da Pelo, F. Frau, P. Lattanzi, K. E. R. England, and D. J. Vaughan, Surf. Interface Anal. 31, 465 (2001). 10.1002/sia.1072
3. ISO 15472: Surface Chemical Analysis-X-ray Photoelectron Spectrometers-Calibration of Energy Scales, #M. P. Seah, Surf. Interface Anal. 31, 721 (2001). 10.1002/sia.1076
4. J. H. Scofield, J. Electron Spectrosc. Relat. Phenom. 8, 129 (1976). 10.1016/0368-2048(76)80015-1
5. R. F. Reilman, A. Msezane, and S. T. Manston, J. Electron Spec-trosc. 8, 389 (1976). 10.1016/0368-2048(76)80025-4