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Volumn 79, Issue 23, 2007, Pages 8987-8993

Quantitative analysis of cadmium selenide nanocrystal concentration by comparative techniques

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC STRIPPING VOLTAMMETRY (ASV); CADMIUM SELENIDE; NANOCRYSTAL CONCENTRATION;

EID: 36849067970     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac0715064     Document Type: Article
Times cited : (42)

References (38)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.