Fast best-effort pattern matching in large attributed graphs

Proceedings of the ACM SIGKDD International Conference on Knowledge Discovery and Data Mining

Volumn , Issue , 2007, Pages 737-746

  Tong, Hanghang ^a   Faloutsos, Christos ^a   Gallagher, Brian ^b   Eliassi Rad, Tina ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Attributed graph; Pattern match; Random walk

Indexed keywords

ATTRIBUTED GRAPH; DATA GRAPHS; SOCIAL NETWORKS;

COMPUTATIONAL COMPLEXITY; DATA ACQUISITION; GRAPH THEORY; INDEXING (OF INFORMATION); QUERY LANGUAGES;

PATTERN MATCHING;

EID: 36849032888     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1281192.1281271     Document Type: Conference Paper

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