3,4-Dibut-oxy-N 2,N 2′-bis-(propan-2-yl-idene) thio-phene-2,5-dicarbohydrazide

Acta Crystallographica Section E: Structure Reports Online

Volumn 63, Issue 12, 2007, Pages

  Li, Hai Lin ^a   Kang, Si Shun ^a   Zeng, Hai Su ^a   Wang, Hai Bo ^a  

^a NANJING TECH UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36849004033     PISSN: 16005368     EISSN: 16005368     Source Type: Journal    
DOI: 10.1107/S160053680705951X     Document Type: Article

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7. Siemens (1996). SHELXTL. Version 5.06. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
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