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Volumn 91, Issue 23, 2007, Pages
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Evolution of phase change memory characteristics with operating cycles: Electrical characterization and physical modeling
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARACTERIZATION;
CRYSTALLINE MATERIALS;
ELECTRIC RESISTANCE;
MATHEMATICAL MODELS;
SEMICONDUCTING GERMANIUM COMPOUNDS;
THRESHOLD VOLTAGE;
ENERGY INPUT;
OPERATING CYCLES;
PHASE CHANGE MEMORY CELLS;
PROGRAMMING OPERATIONS;
DATA STORAGE EQUIPMENT;
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EID: 36849001771
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2821845 Document Type: Article |
Times cited : (41)
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References (11)
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