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Volumn 91, Issue 23, 2007, Pages

Evolution of phase change memory characteristics with operating cycles: Electrical characterization and physical modeling

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTALLINE MATERIALS; ELECTRIC RESISTANCE; MATHEMATICAL MODELS; SEMICONDUCTING GERMANIUM COMPOUNDS; THRESHOLD VOLTAGE;

EID: 36849001771     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2821845     Document Type: Article
Times cited : (41)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.