Electron channeling patterns in the scanning electron microscope

Journal of Applied Physics

Volumn 53, Issue 8, 1982, Pages

  Joy, David C ^a   Newbury, Dale E ^b   Davidson, David L ^c  

^a LUCENT TECHNOLOGIES   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c SOUTHWEST RESEARCH INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36749119332     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.331668     Document Type: Article

References (241)

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45. Application of the Kossel x‐ray back reflection technique in the scanning electron microscope
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80. Geometric surface relief and the allotropic transformation in iron
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83. Direct observation of surface fatique damage in the SEM
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89. Etude de la polygonisation de fluage au moyen des images electroniques au microanalyseur a sonde electronique
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116. Deformation studies at wear tracks in iron
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120. Interpretation of the widths of SEM electron channeling lines
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123. Generating electron channeling patterns in the JSM‐11 SEM
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132. The measurement of electron wavelength
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151. Electron channeling patterns from small (10 micron) selected areas in the SEM
152. The generation and identification of SEM channeling patterns from 10 micron areas
153. Rotation between micrographs from SEM and electron channeling patterns
154. Description d’un dispositif de measure de remission electronique secondaire
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163. Effects of n‐waves on the intensity of Kikuchi lines observed by the SEM
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165. Some modifications of the scanning electron microscope for use in electron channeling pattern observation
166. A simple energy filtering backs‐cattered electron detector
167. A comparison of microdiffraction methods
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172. Coates‐Kikuchi patterns
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176. A transmission stage for the SEM
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183. Computer generation and identification of kikuchi projections