Process capability indices for one-sided specification intervals and skewed distributions

Quality and Reliability Engineering International

Volumn 23, Issue 6, 2007, Pages 755-765

  Vannman, Kerstin ^a   Albing, Malin ^a  

^a LULEÅ UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

Capability index; Confidence interval; Hypothesis test; One sided specification interval; Skewed distributions; Target value 0; Upper specification limit

Indexed keywords

COMPUTER SIMULATION; DECISION MAKING; PROCESS CONTROL; QUALITY ASSURANCE; WEIBULL DISTRIBUTION;

CAPABILITY INDEX; HYPOTHESIS TEST; SKEWED DISTRIBUTIONS;

INDUSTRIAL APPLICATIONS;

EID: 36749103223     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.877     Document Type: Conference Paper

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