In situ imaging of crack growth with piezoelectric-wafer active sensors

AIAA Journal

Volumn 45, Issue 11, 2007, Pages 2758-2769

  Giurgiutiu, Victor ^a,d,e   Yu, Lingyu ^a,d   Kendall III, James R ^b   Jenkins, Christopher ^c  

^a UNIVERSITY OF SOUTH CAROLINA   (United States)

^b LOCKHEED MARTIN SPACE SYSTEMS COMPANY   (United States)

^c TRANE Corporation   (United States)

^d Department of Mechanical Engineering ^*  (United States)

^e AIAA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LAMB WAVE MODES; PIEZOELECTRIC WAFER ACTIVE SENSORS;

ELASTIC WAVES; ELECTROMAGNETIC WAVE TRANSMISSION; IMAGING SYSTEMS; PIEZOELECTRIC DEVICES; SENSORS; STRUCTURAL HEALTH MONITORING;

CRACK PROPAGATION;

EID: 36749100035     PISSN: 00011452     EISSN: None     Source Type: Journal    
DOI: 10.2514/1.30798     Document Type: Article

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