Model-based quantification of EELS spectra: Treating the effect of correlated noise

Ultramicroscopy

Volumn 108, Issue 2, 2008, Pages 74-83

  Verbeeck, J ^a,b   Bertoni, G ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Correlated noise; EELS quantification; Maximum likelihood; Model based quantification

Indexed keywords

MAXIMUM LIKELIHOOD; NOISE ABATEMENT; NUMERICAL ANALYSIS; OPTICAL CORRELATION; PARAMETER ESTIMATION; SPURIOUS SIGNAL NOISE;

CORRELATED NOISE; MODEL-BASED QUANTIFICATION; NOISE POWER;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; COVARIANCE; ELECTRON ENERGY LOSS SPECTROSCOPY; MAXIMUM LIKELIHOOD METHOD; QUANTITATIVE ANALYSIS; SIGNAL NOISE RATIO; STATISTICAL ANALYSIS; THEORETICAL MODEL;

EID: 36749099521     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.03.004     Document Type: Article

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