-
2
-
-
1342290040
-
-
Leu M.S., Chen S.Y., Chang J.J., Chao L.G., and Lin W. Surf. Coat. Technol. 177-178 (2004) 566
-
(2004)
Surf. Coat. Technol.
, vol.177-178
, pp. 566
-
-
Leu, M.S.1
Chen, S.Y.2
Chang, J.J.3
Chao, L.G.4
Lin, W.5
-
6
-
-
10044220774
-
-
Hsieh W.J., Shih P.S., Lin J.H., Lin C.C., Chen U.S., Huang S.C., Chang Y.S., and Shih H.C. Thin Solid Films 469--470 (2004) 120
-
(2004)
Thin Solid Films
, vol.469 --470
, pp. 120
-
-
Hsieh, W.J.1
Shih, P.S.2
Lin, J.H.3
Lin, C.C.4
Chen, U.S.5
Huang, S.C.6
Chang, Y.S.7
Shih, H.C.8
-
7
-
-
9644275585
-
-
Hsieh W.J., Lin C.C., Chen U.S., Chang Y.S., and Shih H.C. Diam. Relat. Mater. 14 (2005) 93
-
(2005)
Diam. Relat. Mater.
, vol.14
, pp. 93
-
-
Hsieh, W.J.1
Lin, C.C.2
Chen, U.S.3
Chang, Y.S.4
Shih, H.C.5
-
8
-
-
0036508126
-
-
Li Y.W., Shue Y.B., Chen C.F., Yu T.C., and Chang J.K. Diam. Relat. Mater. 11 (2002) 1227
-
(2002)
Diam. Relat. Mater.
, vol.11
, pp. 1227
-
-
Li, Y.W.1
Shue, Y.B.2
Chen, C.F.3
Yu, T.C.4
Chang, J.K.5
-
11
-
-
0004033283
-
-
Ross P.J. (Ed), McGraw-Hill Inc., New York, USA
-
In: Ross P.J. (Ed). Taguchi Techniques for Quality Engineering (1996), McGraw-Hill Inc., New York, USA
-
(1996)
Taguchi Techniques for Quality Engineering
-
-
-
13
-
-
13444270614
-
-
Kima H.G., Ahna S.H., Kima J.G., Parkb S.J., and Lee K.R. Thin Solid Films 475 (2005) 291
-
(2005)
Thin Solid Films
, vol.475
, pp. 291
-
-
Kima, H.G.1
Ahna, S.H.2
Kima, J.G.3
Parkb, S.J.4
Lee, K.R.5
-
15
-
-
12044253618
-
-
Marton D., Boyd K.J., Al- Bayati A.H., Todorov S.S., and Rabalais J.W. Phys. Rev. Lett. 73 (1994) 118
-
(1994)
Phys. Rev. Lett.
, vol.73
, pp. 118
-
-
Marton, D.1
Boyd, K.J.2
Al- Bayati, A.H.3
Todorov, S.S.4
Rabalais, J.W.5
-
17
-
-
0032594133
-
-
Chan W.C., Fung M.K., Bello I., Lee C.S., and Lee S.T. Diam. Relat. Mater. 8 (1999) 1732
-
(1999)
Diam. Relat. Mater.
, vol.8
, pp. 1732
-
-
Chan, W.C.1
Fung, M.K.2
Bello, I.3
Lee, C.S.4
Lee, S.T.5
-
22
-
-
0347379740
-
-
Kan M.C., Huang J.L., Sung J.C., Chen K.H., and Lii D.F. Diam. Relat. Mater. 12 (2003) 1691
-
(2003)
Diam. Relat. Mater.
, vol.12
, pp. 1691
-
-
Kan, M.C.1
Huang, J.L.2
Sung, J.C.3
Chen, K.H.4
Lii, D.F.5
-
24
-
-
0041374767
-
-
Sattel S., Ben T.G., Roth H., Scheib M., Samlenski R., Brenn R., Ehrhardt H., and Robertson J. Diam. Relat. Mater. 5 (1996) 425
-
(1996)
Diam. Relat. Mater.
, vol.5
, pp. 425
-
-
Sattel, S.1
Ben, T.G.2
Roth, H.3
Scheib, M.4
Samlenski, R.5
Brenn, R.6
Ehrhardt, H.7
Robertson, J.8
-
26
-
-
0001365311
-
-
Rong Z.Y., Abraizov M., Dorfman B., Strongin M., Yang X.Q., Yan D., and Pollak F.H. Appl. Phys. Lett. 65 (1994) 1379
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 1379
-
-
Rong, Z.Y.1
Abraizov, M.2
Dorfman, B.3
Strongin, M.4
Yang, X.Q.5
Yan, D.6
Pollak, F.H.7
-
27
-
-
0032691245
-
-
Chan W.C., Feng M.K., Lai K.H., Bello I., Lee S.T., and Lee C.S. J. Non-Cryst. Solids 254 (1999) 180
-
(1999)
J. Non-Cryst. Solids
, vol.254
, pp. 180
-
-
Chan, W.C.1
Feng, M.K.2
Lai, K.H.3
Bello, I.4
Lee, S.T.5
Lee, C.S.6
-
29
-
-
0001228085
-
-
Dowling D.P., Kola P.V., Donnelly K., Kelly T.C., Brumitt K., Lloyd L., Eloy R., Therin M., and Weill N. Diam. Relat. Mater. 6 (1997) 390
-
(1997)
Diam. Relat. Mater.
, vol.6
, pp. 390
-
-
Dowling, D.P.1
Kola, P.V.2
Donnelly, K.3
Kelly, T.C.4
Brumitt, K.5
Lloyd, L.6
Eloy, R.7
Therin, M.8
Weill, N.9
-
30
-
-
4544377153
-
-
Lin J.F., Wan Z.C., Wei P.F., Chu H.Y., and Ai C.F. Thin Solid Films 466 (2004) 137
-
(2004)
Thin Solid Films
, vol.466
, pp. 137
-
-
Lin, J.F.1
Wan, Z.C.2
Wei, P.F.3
Chu, H.Y.4
Ai, C.F.5
-
33
-
-
0037708522
-
-
Liu D., Benstetter G., Lodermeier E., Akula I., Dudarchyk I., Liu Y., and Ma T. Surf. Coat. Technol. 172 (2003) 194
-
(2003)
Surf. Coat. Technol.
, vol.172
, pp. 194
-
-
Liu, D.1
Benstetter, G.2
Lodermeier, E.3
Akula, I.4
Dudarchyk, I.5
Liu, Y.6
Ma, T.7
-
35
-
-
1842782311
-
-
Li H.X., Xu T., Chen J.M., Zhou H.D., and Lin H.W. Appl. Surf. Sci. 227 (2004) 364
-
(2004)
Appl. Surf. Sci.
, vol.227
, pp. 364
-
-
Li, H.X.1
Xu, T.2
Chen, J.M.3
Zhou, H.D.4
Lin, H.W.5
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