Relaxation processes of transient current in nano-contact system: Effects of electrode

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 4, Issue 2, 2007, Pages 481-484

  Ishii, Hiroyuki ^a,b   Tomita, Yoko ^c   Nakayama, Takashi ^c  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

) ELECTRONIC STATE; BAND EDGES; CALCULATION METHODS; CURRENT DYNAMICS; DENSITY MATRICES; ELECTRON DISSIPATION; ELECTRONIC LEVELS; ENERGY DIFFERENCES; FERMI ENERGY; INTERNATIONAL CONFERENCES; LIOUVILLE EQUATIONS; NANO CONTACTS; NANO-DEVICES; OSCILLATION PERIODS; PHASE INTERFERENCE; TRANSIENT CURRENT;

ELECTROLYSIS; MODULATION; NANOSTRUCTURES; NANOSYSTEMS; OPTICAL DEVICES;

METALLIZING;

EID: 36749091576     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200673202     Document Type: Conference Paper

References (4)

1. K. Tagami and M. Tsukada, Curr. Appl. Phys. 3, 439 (2003).
2. H. Ishii and T. Nakayama, Phys. Rev. B 73, 235311 (2006).
3. B. Naser, J. Heeren, D. K. Ferry, and J. P. Bird, Rev. Sci. Instrum. 96, 113905 (2005).
4. G. Stefanucci and C.-O. Almbladh, Phys. Rev. B 69, 195318 (2004).