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Volumn 78, Issue 11, 2007, Pages

High precision metrology based microwave effective linewidth measurement technique

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS; MAGNETIC FIELDS; MICROWAVES; POLYCRYSTALLINE MATERIALS; RANDOM ERRORS; UNCERTAINTY ANALYSIS;

EID: 36749059586     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2813344     Document Type: Article
Times cited : (8)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.