Study on the influence of key errors on the deciphered image in the double random phase encryption system by applying affine cryptography

Journal of Modern Optics

Volumn 55, Issue 1, 2008, Pages 167-176

  Dong, Lai ^a   Xin, Zhou ^a   Ding Fu, Zhou ^b   Da Hai, Li ^a  

^a SICHUAN UNIVERSITY   (China)

^b South West Inst of Tech Phys   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; IMAGE ANALYSIS; OPTICAL SYSTEMS; PIXELS; RANDOM PROCESSES; SIGNAL TO NOISE RATIO;

AFFINE CRYPTOGRAPHY; DECIPHERING PROCESS; RANDOM PHASE ENCRYPTION; RANDOM PHASE MASKS;

CRYPTOGRAPHY;

EID: 36749051773     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500340701345619     Document Type: Article

References (15)

1. P. Refregier and B. Javidi, Opt. Lett. 20 767 (1995).
2. B. Javidi, A. Sergent, G.S. Zhang, et al., Opt. Eng. 36 992 (1997).
3. R. Wang and C. Chatwin, Opt. Eng. 35 2464 (1996).
4. W. Bender, D. Gruhl, N. Morimoto, et al., IBM Syst. J. 35 313 (1996).
5. J. Rosen and B. Javidi, Appl. Opt. 40 3346 (2001).
6. G.C. Langelaar, I. Setyawan and R.L. Lagemdijk, IEEE Signal Process. Mag. 17 20 (2000).
7. S. Kishk and B. Javidi, Appl. Opt. 41 5462 (2002).
8. O. Matoba and B. Javidi, Appl. Opt. 43 2915 (2004).
9. N. Takai and Y. Mifune, Appl. Opt. 41 865 (2002).
10. X. Zhou, S. Yuan, S. Wang, et al., Appl. Opt. 45 8434 (2006).
11. C.C. Shin, Opt. Commun. 48 495 (1995).
12. G.H. Golub and CF. Van Loan, Matrix Computations, 3rd ed. (The John Hopkins University Press, London, 1996).
13. D.R. Stinson, Cryptography: Theory and Practice, 2nd ed. (CRC Press LLC, New York, 2002).
14. G. Unnikrishnan and K. Singh, Opt. Commun. 193 51 (2001).
15. F. Goudail, B. Javidi and P. Refregier, J. Opt. Soc. Am. A 15 2629 (1998).