Application of Response Surface Methodology to laser-induced breakdown spectroscopy: Influences of hardware configuration

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 62, Issue 12, 2007, Pages 1335-1342

  Cowpe, J S ^a   Astin, J S ^a   Pilkington, R D ^a   Hill, A E ^a  

^a UNIVERSITY OF SALFORD   (United Kingdom)

Author keywords

Hardware; LIBS; Optimization; Response Surface Methodology; Silicon

Indexed keywords

OPTIMIZATION; PARAMETER ESTIMATION; SIGNAL NOISE MEASUREMENT; SILICON COMPOUNDS; SPECTROSCOPIC ANALYSIS; SURFACE ANALYSIS;

HARDWARE CONFIGURATION; QUALITY FACTOR; RESPONSE SURFACE METHODOLOGY; SPECTROMETER GAIN;

SINGLE CRYSTALS;

EID: 36749005671     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2007.10.035     Document Type: Article

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