Palmprint verification based on principal lines

Pattern Recognition

Volumn 41, Issue 4, 2008, Pages 1316-1328

  Huang, De Shuang ^a   Jia, Wei ^a,b   Zhang, David ^c  

^a INSTITUTE OF INTELLIGENT MACHINES   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^c HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

Biometrics; Line detection; Modified finite Radon transform; Palmprint; Principal lines

Indexed keywords

ALGORITHMS; DATABASE SYSTEMS; MATHEMATICAL TRANSFORMATIONS; VERIFICATION;

MODIFIED FINITE RADON TRANSFORM; PALMPRINT; PRINCIPAL LINES;

PATTERN RECOGNITION;

EID: 36749001605     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2007.08.016     Document Type: Article

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