Comparing reliability and security: Concepts, requirements, and techniques

Bell Labs Technical Journal

Volumn 12, Issue 3, 2007, Pages 65-78

  Hanmer, Robert S ^a,b,c,d   McBride, Donald T ^a   Mendiratta, Veena B ^e  

^a NOKIA RESEARCH CENTER   (United States)

^b IEEE

^c Hillside Group   (United States)

^d ASSOCIATION FOR COMPUTING MACHINERY   (United States)

^e LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFORMATION FLOWS; RELIABILITY ENGINEERING; RELIABILITY FAILURES; SECURE SYSTEMS;

FAILURE ANALYSIS; INFORMATION RETRIEVAL; SECURITY OF DATA; SECURITY SYSTEMS; TELECOMMUNICATION;

RELIABILITY ANALYSIS;

EID: 36649016915     PISSN: 10897089     EISSN: 15387305     Source Type: Journal    
DOI: 10.1002/bltj.20250     Document Type: Article

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