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Volumn 238, Issue , 2007, Pages 255-268
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Self-selection bias in reputation systems
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Author keywords
[No Author keywords available]
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Indexed keywords
EXPECTED VALUES;
REPUTATION SYSTEMS;
SELF-SELECTION BIAS;
INFORMATION TECHNOLOGY;
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EID: 36649004540
PISSN: 15715736
EISSN: None
Source Type: Book Series
DOI: 10.1007/978-0-387-73655-6_17 Document Type: Conference Paper |
Times cited : (15)
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References (5)
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