Experimental determination of the nanocrystalline volume fraction in silicon thin films from Raman spectroscopy

Applied Physics Letters

Volumn 52, Issue 20, 1988, Pages 1675-1677

  Bustarret, E ^a   Hachicha, M A ^a   Brunel, M ^b  

^a CNRS   (France)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

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EID: 36549104969     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.99054     Document Type: Article

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