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Volumn 52, Issue 15, 1988, Pages 1237-1239
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Reduction in the concentration of DX centers in Si-doped GaAlAs using the planar doping technique
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 36549103776
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.99167 Document Type: Article |
Times cited : (40)
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References (17)
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