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Journal of Applied Physics

Volumn 63, Issue 9, 1988, Pages 4548-4554

Logarithmic detrapping response for holes injected into SiO2 and the influence of thermal activation and electric fields

(2) Lakshmanna, V a Vengurlekar, A S a

a TATA INSTITUTE OF FUNDAMENTAL RESEARCH (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36549103418 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.340153 Document Type: Article

Times cited : (60)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.