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Volumn 51, Issue 12, 1987, Pages 919-921
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Study of thermally oxidized yttrium films on silicon
a
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 36549102892
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.98801 Document Type: Article |
Times cited : (133)
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References (0)
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