Characterization of strained InGaAs single quantum well structures by ion beam methods

Applied Physics Letters

Volumn 56, Issue 1, 1990, Pages 45-47

  Yu, Kin Man ^a   Chan, K T ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36549101910     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.102642     Document Type: Article

References (15)