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Applied Physics Letters

Volumn 57, Issue 25, 1990, Pages 2692-2694

Raman scattering from quantum dots of Ge embedded in SiO2 thin films

(3) Fujii, Minoru a Hayashi, Shinji a Yamamoto, Keiichi a

a KOBE UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36549100950 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.103802 Document Type: Article

Times cited : (140)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.