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Volumn 57, Issue 6, 1985, Pages 1978-1984
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Quantification of the effects of generation volume, surface recombination velocity, and diffusion length on the electron-beam-induced current and its derivative: Determination of diffusion lengths in the low micron and submicron ranges
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 36549098117
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.334382 Document Type: Article |
Times cited : (60)
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References (14)
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