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Volumn 57, Issue 6, 1985, Pages 1978-1984

Quantification of the effects of generation volume, surface recombination velocity, and diffusion length on the electron-beam-induced current and its derivative: Determination of diffusion lengths in the low micron and submicron ranges

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EID: 36549098117     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.334382     Document Type: Article
Times cited : (60)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.