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Journal of Applied Physics

Volumn 65, Issue 9, 1989, Pages 3560-3567

Interface capacitance in metal-semiconductor junctions

(2) Wu, Xu a Yang, Edward S a

a Columbia University ^* (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36549095667 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.342631 Document Type: Article

Times cited : (62)

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