Measurements of the optical properties of liquid silicon and germanium using nanosecond time-resolved ellipsometry

Applied Physics Letters

Volumn 51, Issue 5, 1987, Pages 352-354

  Jellison Jr , G E ^a   Lowndes, D H ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

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Indexed keywords

EID: 36549094807     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.98438     Document Type: Article

References (9)