Improved feedback charge method for quasistatic CV measurements in semiconductors

Review of Scientific Instruments

Volumn 57, Issue 11, 1986, Pages 2798-2805

  Mego, Thomas J ^a  

^a Keithley Instruments Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36549093167     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1139046     Document Type: Article

References (8)