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Volumn 56, Issue 12, 1990, Pages 1184-1186
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Infrared spectra and electron spin resonance of vanadium deep level impurities in silicon carbide
a a a a a b c c
c
SIEMENS AG
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 36549092940
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.102555 Document Type: Article |
Times cited : (152)
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References (8)
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