Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity

Journal of Applied Physics

Volumn 63, Issue 6, 1988, Pages 1936-1941

  Lucas, C A ^a   Hatton, P D ^a   Bates, S ^a   Ryan, T W ^a   Miles, S ^b   Tanner, B K ^b  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

^b DURHAM UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36549091780     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.339895     Document Type: Article

References (12)