Quantitative determination of a subsurface defect of reference specimen by lock-in infrared thermography

NDT and E International

Volumn 41, Issue 2, 2008, Pages 119-124

  Choi, Manyong ^a   Kang, Kisoo ^a   Park, Jeonghak ^a   Kim, Wontae ^b   Kim, Koungsuk ^c  

^a Korea Research Institute of Standards and Science   (South Korea)

^b Kongju National University   (South Korea)

^c Chosun University   (South Korea)

Author keywords

Defect size; Infrared thermography; Lock in; Quantification; Shearing phase

Indexed keywords

IMAGE ANALYSIS; PARAMETER ESTIMATION; PIXELS; THERMOGRAPHY (IMAGING);

DEFECT SIZE; SHEARING PHASE;

DEFECTS;

EID: 36549059601     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2007.08.006     Document Type: Article

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