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Volumn 403, Issue 1, 2008, Pages 145-151

Structural characterization and electrical properties of quaternary CdGaInSe4 thin films

Author keywords

Electrical properties; Quaternary compounds; Structural characterization; Thin Films

Indexed keywords

CHARGE CARRIERS; CRYSTAL STRUCTURE; ELECTRIC PROPERTIES; ELECTRON DIFFRACTION; SILICA; THERMAL EVAPORATION;

EID: 36549047942     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2007.08.090     Document Type: Article
Times cited : (7)

References (24)
  • 10
    • 36549018319 scopus 로고    scopus 로고
    • M. Calligasris, in: Proceedings of Third International School and Workshop of Crystallography on X-ray Powder Diffraction and its Applications, January 1990, Cairo, Egypt, National Committee of Crystallography, 1990.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.