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Volumn 19, Issue 3-4, 2007, Pages 81-83
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Existing length of precursor film on inclined solid substrate
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Author keywords
[No Author keywords available]
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Indexed keywords
FLOW PATTERNS;
INTERFEROMETERS;
PHASE INTERFACES;
SILICON WAFERS;
SOLID SOLUTIONS;
SUBSTRATES;
BOUNDARY LINES;
CONTACT LINES;
INCLINED SOLID SUBSTRATES;
STATIC PRESSURE;
FLUID DYNAMICS;
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EID: 36549037172
PISSN: 09380108
EISSN: None
Source Type: Journal
DOI: 10.1007/BF02915759 Document Type: Conference Paper |
Times cited : (11)
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References (5)
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