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Volumn 78, Issue 12, 1995, Pages 7103-7108
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Effects of oxygen-argon mixing on the electrical and physical properties of ZrTiO4 films sputtered on silicon at low temperature
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 36449009802
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.360418 Document Type: Article |
Times cited : (28)
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References (0)
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