Correlation of dielectric breakdown with hole transport for ultrathin thermal oxides and N2O oxynitrides

Applied Physics Letters

Volumn , Issue , 1995, Pages 1126-

  Hao, M Y ^a   Chen, W M ^a   Lai, K ^a   Lee, J C ^a   Gardner, M ^b   Fulford, J ^b  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449008667     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.113834     Document Type: Article

References (10)