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Journal of Applied Physics

Volumn 72, Issue 3, 1992, Pages 964-970

The inflow moments method for the description of electron transport at material interfaces

(1) Schroeder, Dietmar a

a HAMBURG UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449007939 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.351773 Document Type: Article

Times cited : (12)

References (29)

1
- 80055008559
- Sept. 12–14, 1991, Zurich, edited by W. Fichtner and D. Aem-mer (Hartung-Gorre, Konstanz)
- (1991) Proceedings of the 4th International Conference on Simulation of Semiconductor Devices and Processes , pp. 205
- Gnudi, A.¹ Ventura, D.² Baccarani, G.³

2
- 0346098793
- (1988) J. Appl. Phys. , vol.64 , pp. 2447
- Bringer, A.¹ Schoen, G.²

3
- 0023436334
- (1987) Semicond. Sci Technol. , vol.2 , pp. 643
- McAndrew, C.¹ Heasell, E.² Singhal, K.³

4
- 0006331787
- (1987) Solid-State Electron. , vol.30 , pp. 913
- Azoff, E.¹

5
- 0000263622
- (1986) J. Appl. Phys. , vol.60 , pp. 650
- Hänsen, W.¹ Miura-Mattausch, M.²

6
- 0022044296
- (1985) Solid State Electron. , vol.28 , pp. 407
- Baccarani, G.¹ Wordeman, M.²

7
- 4243195579
- edited by W. Engl, Advances in CAD for VLSI (North-Holland, Amsterdam)
- (1986) Process and Device Modeling , vol.1 , pp. 107
- Baccarani, G.¹

8
- 0022760113
- (1986) Jpn. J. Appl. Phys. , vol.25 , pp. 1221
- Maeda, H.¹

9
- 0018444725
- (1979) Solid-State Electron. , vol.22 , pp. 241
- Wu, C.¹ Yang, E.²

10
- 84954059913
- Sept. 26–28, Bologna, edited by G. Baccarani and M. Rudan
- (1988) Proc. 3rd Int. Conf. on Simulation of Semiconductor Devices and Processes , pp. 97
- Mottet, S.¹ Viallet, J.²

11
- 0025418806
- (1990) IEEE Trans. Electron Dev. , vol.ED-37 , pp. 1093
- Horio, K.¹ Yanai, H.²

12
- 0001223532
- Sept. 12–14, 1991, Zurich, edited by W. Fichtner and D. Aemmer (Hartung-Gorre, Konstanz)
- (1991) Proceedings of the 4th International Conference on Simulation of Semiconductor Devices and Processes , pp. 303
- Grupen, M.¹ Hess, K.² Song, G.³

13
- 0023308996
- (1988) Solid-State Electron. , vol.31 , pp. 363
- Mosko, M.¹ Novak, I.² Quittner, P.³

14
- 0025511172
- (1990) IEEE Trans. Comp.-Aided Design , vol.CAD-9 , pp. 1136
- Schroeder, D.¹

15
- 12444323867
- Dec. 8–11, Washington DC
- (1991) 1991 International Electron Devices Meeting, Digest of Technical Papers , pp. 507
- Pinto, M.¹ Luryi, S.²

16
- 36149018649
- (1962) Phys. Rev. , vol.126 , pp. 2002
- Stratton, R.¹

17
- 0024030448
- (1988) Solid-State Electron. , vol.31 , pp. 1031
- Darling, R.¹

18
- 0025430605
- (1990) IEEE Trans. Electron Dev. , vol.ED-37 , pp. 1228
- Hjelmgren, H.¹

19
- 0004269209
- (Holt, Rinehart, and Winston, New York)
- (1976) Solid State Phys.
- Ashcroft, N.¹ Mermin, N.²

20
- 0003977166
- (Krieger)
- (1980) A Vector Space Approach to Models and Optimization
- Dorny, C.¹

21
- 0003435706
- (Springer, Wien)
- (1990) Semiconductor Equations
- Markowich, P.¹ Ringhofer, C.² Schmeiser, C.³

22
- 84916395750
- July 11–14 Dublin, edited by J. J. H. Miller (Boole, Dun Laoghaire), 1989
- (1989) Proceedings of the 6th International Conference on Numerical Analysis of Semiconductor Devices and Integrated Circuits (NASECODE VI) , pp. 484
- Schroeder, D.¹

23
- 0024482703
- (1989) Solid-State Electron. , vol.32 , pp. 95
- Maby, E.¹

24
- 0025432531
- (1990) Semicond. Sci. Technol. , vol.5 , pp. 435
- Schroeder, D.¹

25
- 0016992904
- (1976) J. Appl. Phys. , vol.47 , pp. 4122
- Baccarani, G.¹

26
- 0022144794
- (1985) Solid-State Electron. , vol.28 , pp. 1007
- Berz, F.¹

27
- 0000766947
- (1966) Solid-State Electron. , vol.9 , pp. 1035
- Crowell, C.¹ Sze, S.²

28
- 0026869483
- (1992) Electron. Lett. , vol.28 , pp. 995
- Schroeder, D.¹ Ventura, D.² Gnudi, A.³ Baccarani, G.⁴

29
- 0344132317
- Sept. 12–14, 1991, Zurich, edited by W. Fichtner and D. Aemmer (Hartung-Gorre, Konstanz)
- (1991) Proceedings of the 4th International Conference on Simulation of Semiconductor Devices and Processes , pp. 313
- Schroeder, D.¹

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