Structures and defects induced during annealing of sputtered near-equiatomic NiTi shape memory thin films

Applied Physics Letters

Volumn , Issue , 1995, Pages 2656-

  Gong, F F ^a   Shen, H M ^a   Wang, Y N ^a  

^a NANJING UNIVERSITY   (China)

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EID: 36449007110     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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