Observation of degradation processes of Al electrodes in organic electroluminescence devices by electroluminescence microscopy, atomic force microscopy, scanning electron microscopy, and Auger electron spectroscopy

Journal of Applied Physics

Volumn 76, Issue 9, 1994, Pages 5118-5121

  Do, L M ^a   Han, E M ^a   Niidome, Y ^a   Fujihira, M ^a   Kanno, T ^b   Yoshida, S ^b   Maeda, A ^b   Ikushima, A J ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b HOYA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449006959     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.357224     Document Type: Article

References (19)