Microwave power dependence of YBa2Cu3O7 thin-film Josephson edge junctions

Applied Physics Letters

Volumn , Issue , 1995, Pages 705-

  Oates, D E ^a   Nguyen, P P ^a,b   Habib, Y ^a,b   Dresselhaus, G ^a,b,c   Dresselhaus, M S ^a   Koren, G ^d   Polturak, E ^d  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

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EID: 36449006699     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116598     Document Type: Article

References (0)