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Volumn 62, Issue 25, 1993, Pages 3348-3350

Optical functions of chemical vapor deposited thin-film silicon determined by spectroscopic ellipsometry

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[No Author keywords available]

Indexed keywords


EID: 36449006678     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.109067     Document Type: Article
Times cited : (253)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.