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Volumn 62, Issue 25, 1993, Pages 3348-3350
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Optical functions of chemical vapor deposited thin-film silicon determined by spectroscopic ellipsometry
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 36449006678
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.109067 Document Type: Article |
Times cited : (253)
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References (18)
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