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Journal of Applied Physics

Volumn 69, Issue 5, 1991, Pages 3077-3081

Temperature dependence of minority-carrier lifetime in iron-diffused p-type silicon wafers

(5) Hayamizu, Y a Hamaguchi, T a Ushio, S a Abe, T a Shimura, F b

a SHIN ETSU CHEMICAL CO LTD (Japan)

b NORTH CAROLINA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449006203 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.348570 Document Type: Article

Times cited : (41)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.